Mixed-Signal Generic Testing in Photonic Integration

Introduction

This book describes testing methods for Novel Photonic Integrated Circuits, which have become one of the hottest topics in the context of information technology. Readers will learn that these objects are used not only to enhance the throughput of optical communications (backbone of the internet network), but also to for smart-sensing, metrology, quantum application and artificial intelligence. The increasing demand for this kind of device drives the need for fast and effective testing methods, as described in this book.