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This volume documents the proceedings of the 8th International Symposium on Particles on Surfaces: Detection, Adhesion and Removal held in Providence, Rhode Island, June 24a 26, 2002.
The study of particles on surfaces is extremely crucial in a host of diverse technological areas, ranging from microelectronics to optics to biomedical.
Particles on Surfaces: Detection, Adhesion and Removal, Volume 7
Particles on Surfaces
Contact Angle, Wettability and Adhesion, Volume 3
Surface Contamination and Cleaning
Developments in Surface Contamination and Cleaning, Volume 3
Adhesion Measurement of Films and Coatings, Volume 2
Adhesion Measurement of Films and Coatings
Particle Adhesion and Removal
Adhesion Aspects of Thin Films, volume 2
Contact Angle, Wettability and Adhesion, Volume 2
Adhesion Aspects of Thin Films, Volume 1
Developments in Surface Contamination and Cleaning, Volume 8
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