Failure Analysis

$100.99

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Failure Analysis

High Technology Devices

Testing of materials Electronics and communications engineering

Authors: Daniel J. D. Sullivan, Eric J. Carleton

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Collection: De Gruyter STEM

Language: English

Published by: De Gruyter

Published on: 24th October 2022

Format: LCP-protected ePub

ISBN: 9781501516474

Book Overview

The book presents a unique view of failure analysis of high technology devices. It describes capabilities and limitations of many analytical techniques and testing paths and decisions best followed in example failure analysis studies.

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