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Electron Nano-imaging
Basics of Imaging and Diffraction for TEM and STEM
Second Edition Overview
In this second edition, most chapters of the first edition, which was published in 2017, have been revised. Recent advancements in electron microscopy, such as differential phase contrast (DPC) STEM, sparse-coding image processing, and quantum electron microscopy, have been supplemented with further details.
Book Content and Approach
This book explains the basis of imaging and diffraction in transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) in the style of a textbook. It focuses on the explanation of electron microscopic imaging of TEM and STEM without including in the main text distracting information on basic knowledge of crystal diffraction, wave optics, electron lens, and scattering and diffraction theories, which are explained separately in the appendices.
Unique Features
The comprehensive explanation is provided on the basis of Fourier transform theory, and this approach is unique compared to other advanced resources on high-resolution electron microscopy. With this textbook, readers are led to understand the essence of the imaging theories of TEM and STEM without being diverted by various kinds of knowledge around electron microscopy.
Target Audience and Value
The up-to-date information in this book, particularly on imaging details of STEM and aberration corrections, is valuable worldwide for today’s graduate students and professionals just starting their careers.
