Aberration Theory in Electron and Ion Optics

Advances in Imaging and Electron Physics, Volume 227

Part of the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

Provides the authority and expertise of leading contributors from an international board of authors

Presents the latest release in the Advances in Imaging and Electron Physics series