£89.50
VLSI Design and Test
23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers
Event Description
This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019.
Content Overview
The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.
