Measurement Techniques for Radio Frequency Nanoelectronics

£123.00

Measurement Techniques for Radio Frequency Nanoelectronics

Condensed matter physics (liquid state and solid state physics) Materials science Microwave technology

Authors: T. Mitch Wallis, Pavel Kabos

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Collection: The Cambridge RF and Microwave Engineering Series

Language: English

Published by: Cambridge University Press

Published on: 14th September 2017

Format: LCP-protected ePub

Size: 19 Mb

ISBN: 9781108325912


Connect basic theory with real-world applications

This practical, cross-disciplinary guide to radio frequency measurement of nanoscale devices and materials helps you learn the techniques needed for characterizing the performance of devices and their constituent building blocks, including semiconducting nanowires, graphene, and other two dimensional materials such as transition metal dichalcogenides.

Gain practical insights into instrumentation, including on-wafer measurement platforms and scanning microwave microscopy. Discover how measurement techniques can be applied to solve real-world problems, in areas such as passive and active nanoelectronic devices, semiconductor dopant profiling, subsurface nanoscale tomography, nanoscale magnetic device engineering, and broadband, spatially localized measurements of biological materials.

Featuring numerous practical examples, and written in a concise yet rigorous style, this is the ideal resource for researchers, practicing engineers, and graduate students new to the field of radio frequency nanoelectronics.

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