This book constitutes the proceedings of the 27th International Symposium on VLSI Design and Test, VDAT 2023. The 32 regular papers and 16 short papers presented in this book are carefully reviewed and selected from 220 submissions. They are organized in topical sections as follows:

Low-Power Integrated Circuits and Devices

FPGA-Based Design and Embedded Systems

Memory, Computing, and Processor Design

CAD for VLSI

Emerging Integrated Circuits and Systems

VLSI Testing and Security

System-Level Design