Conductive Atomic Force Microscopy

£135.00

Conductive Atomic Force Microscopy

Applications in Nanomaterials

Chemistry Nanotechnology Electronic devices and materials Applied optics

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Language: English

Published by: Wiley-VCH

Published on: 3rd August 2017

Format: LCP-protected ePub

Size: 26 Mb

ISBN: 9783527699797


Introduction

The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale.

Global Perspective

To provide a global perspective, the chapters are written by leading researchers and application scientists from all over the world and cover novel strategies, configurations and setups where new information will be obtained with the help of CAFM.

Target Audience

With its substantial content and logical structure, this is a valuable reference for researchers working with CAFM or planning to use it in their own fields of research.

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